
Appendix C: Device Data Format
106 Siemens Energy & Automation, Inc.
General Status Word 3:
1
13 Bit Contents
8–15 Not Used
7 Differential protection is active (Valid)
6 Differential protection is active (Status)
5 External trip 2 is active (Valid)
4 External trip 2 is active (Status)
3 External trip 1 is active (Valid)
2 External trip 1 is active (Status)
1 Back-up overcurrent prot. is active (Valid)
0 Back-up overcurrent prot. is active (Status)
Number of Last Fault 14 0…32767, 0 = no faults
Fault Date/Time (ms) 15 0…59999 (ms )
Fault Date/Time (h/m) 16 High byte: HH (0…23), Low byte: MM (0…59)
Fault Date/Time (m/d) 17 High byte: MM (1…12); Low byte: DD (1…31)
Fault Date/Time (y) 18 Year: YY (00…99)
Diff. Curr. Of L1 at Trip
(fundamental)
19 ms since fault (-1 = no occurrence)
Diff. Curr. Of L1 at Trip
(fundamental)
20 Low word
Diff. Curr. Of L1 at Trip
(fundamental)
21 High word
Diff. Curr. Of L2 at Trip
(fundamental)
22 ms since fault (-1 = no occurrence)
Diff. Curr. Of L2 at Trip
(fundamental)
23 Low word
Diff. Curr. Of L2 at Trip
(fundamental)
24 High word
Diff. Curr. Of L3 at Trip
(fundamental)
25 ms since fault (-1 = no occurrence)
Diff. Curr. Of L3 at Trip
(fundamental)
26 Low word
Diff. Curr. Of L3 at Trip
(fundamental)
27 High word
Restr. Curr. Of L1 at Trip
(average DC)
28 ms since fault (-1 = no occurrence)
Restr. Curr. Of L1 at Trip
(average DC)
29 Low word
Restr. Curr. Of L1 at Trip
(average DC)
30 High word
Restr. Curr. Of L2 at Trip
(average DC)
31 ms since fault (-1 = no occurrence)
Restr. Curr. Of L2 at Trip
(average DC)
32 Low word
Restr. Curr. Of L2 at Trip
(average DC)
33 High word
Restr. Curr. Of L3 at Trip
(average DC)
34 ms since fault (-1 = no occurrence)
Restr. Curr. Of L3 at Trip
(average DC)
35 Low word
Restr. Curr. Of L3 at Trip
(average DC)
36 High word
Fault in the power system 37 ms since fault (-1 = no fault)
Real-Time Device Data Stored in PLC (7UT512) (Continued)
Function Register Location in
PLC Block
Range or Contents
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